Bhattacharyya, D.Sahoo, N. K.Thakur, S.Das, N. C.2019-05-202019-05-202002Thin Solid Films, 2002. Vol. 416: pp. 97-105http://hdl.handle.net/123456789/184164176 bytestext/htmlenSpectroscopic ellipsometryDielectricBeamPhase modulated spectroscopic ellipsometry of dielectric multilayer beam combinerArticle