Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses

Senthilkumar, M.Sahoo, N. K.Thakur, S.Tokas, R. B.2018-08-242018-08-242005Applied Surface Science, 2005. Vol. 252: pp. 1608-1619http://hdl.handle.net/123456789/167714910 bytestext/htmlenReactive electron beam evaporationSurface microroughnessPower spectral densityCharacterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analysesArticle