Aswal, D. K.Muthe, K. P.Joshi, N.Debnath, A. K.Gupta, S. K.Yakhmi, J. V.2021-09-202021-09-202003Journal of Crystal Growth, 2003. Vol. 256 (42767): pp. 201-205http://hdl.handle.net/123456789/234764043 bytestext/htmlenBilayersDiffusionX-ray photoelectron spectroscopyMolecular beam epitaxyIn situ X-ray photoelectron spectroscopy of Ag/Al bilayers grown by molecular beam epitaxyArticle