Sumesh, C. G.Vinod Kumar, A.Tripathi, R. M.Nair, R. N.Puranik, V. D.2014-06-022014-06-022013Radiation Measurements, 2013. Vol. 59: pp. 241-244http://hdl.handle.net/123456789/94754163 bytestext/htmlenCorrection factorRAD7Short half lifeRadon interferenceDouble filter assemblyImpact of flow rate on sensitivity of semiconductor type thoron monitorArticle