Interface studies of Mo/Si multilayers with carbon diffusion barrier by grazing incidence extended X-ray absorption fine structure

Abharana, N.Biswas, A.Sarkar, P.Rajput, P.Rajnarayan, D.Rao, K. D.Modi, M. H.Bhattacharyya, D.Jha, S. N.Sahoo, N. K.2019-08-262019-08-262019Thin Solid Films, 2019. Vol. 673: pp. 126-135http://hdl.handle.net/123456789/191414935 bytestext/htmlenIon beam sputteringGrazing incidence X-ray reflectivityGrazing-incidence extended X-ray absoprtion fine structureMultilayersInterfacesInterface studies of Mo/Si multilayers with carbon diffusion barrier by grazing incidence extended X-ray absorption fine structureArticle