Haque, S. M.De, R.Prathap, C.Mishra, S.Rao, K. D.2022-08-022022-08-022021Optical Materials, 2021. Vol. 117: Article no. 111135http://hdl.handle.net/123456789/248924927 bytestext/htmlenAg–TiO2 thin filmElectron beam evaporationLocalized surface plasmon resonanceSpectroscopic ellipsometryContinuous wave laserLaser damageCW laser damage study in Ag/TiO2 bilayer thin films: Role of interfacially diffused plasmonic silver nanoparticlesArticle