Sahoo, N. K.Thakur, S.Senthilkumar, M.Das, N. C.2018-08-232018-08-232005Applied Physics A, 2005. Vol. 80: pp. 829-839http://hdl.handle.net/123456789/167584749 bytestext/htmlenDetermination and analysisnon-linear index profileselectron-beam-depositedThickness-dependent index non-linearitythin filmsDetermination and analysis of non-linear index profiles in electron-beam-depositedArticle