Sahoo, N. K.Thakur, S.Senthilkumar, M.Bhattacharyya, D.Das, N. C.2021-08-252021-08-252003Thin Solid Films, 2003. Vol. 440 (42767): pp. 155-168http://hdl.handle.net/123456789/233354285 bytestext/htmlenMultilayersOptical propertiesAtomic force microscopyOptical coatingSurface morphologyEllipsometryGadolinium oxideMicrostructural propertiesViscoelastic propertyForce modulationE-beam evaporationReactive electron beam evaporation of gadolinium oxide optical thin films for ultraviolet and deep ultraviolet laser wavelengthsArticle