Meenakshi, S.Vijayakumar, V.Godwal, B. K.Eifler, A.Orgzall. I.Tkachev, S.Hochheimer, H. D.2007-09-202007-09-202006http://hdl.handle.net/123456789/6504495 bytestext/htmlenHigh pressureX-ray diffractionCdAl2Se4Raman studiesHgAl2Se4ZnAl2Se4High pressure X-ray diffraction study of CdAl2Se4 and Raman study of AAl2Se4 (A = Hg, Zn) and CdAl2X4 (X = Se, S)Article