Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect Transistors

Padma, N.Maheshwari, P.Bhattacharya, D.Tokas, R. B.Sen, S.Honda, Y.Basu, SaibalPujari, P. K.Chandrasekhar Rao, T. V.2016-06-242016-06-242016ACS Applied Materials and Interfaces, 2016. Vol. 8 (5): pp. 3376-3385http://hdl.handle.net/123456789/131874853 bytestext/htmlenOFETsubstrate temperaturegrowth mode of CuPcthreshold voltage stabilitypositron annihilation spectroscopyX ray reflectivityInvestigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect TransistorsArticle