Sahoo, N. K.Thakur, S.Senthilkumar, M.Das, N. C.2021-08-062021-08-062003Applied Surface Science, 2003. Vol. 206: pp. 271-293http://hdl.handle.net/123456789/232314533 bytestext/htmlenSurface viscoelasticityForce modulationForce±distance scanning probe microscopySurface viscoelasticity studies of Gd2O3, SiO2 optical thin films and multilayers using force modulation and force-distance scanning probe microscopyArticle