Jena, S.Tokas, R. B.Tripathi, S.Rao, K. D.Udupa, D. V.Thakur, S.Sahoo, N. K.2019-05-232019-05-232019Journal of Alloys and Compounds, 2019. Vol. 771: pp. 373-381http://hdl.handle.net/123456789/184954635 bytestext/htmlenHfO2 thin filmsMicrostructureOptical propertiesResidual stressLaser induced damage thresholdInfluence of oxygen partial pressure on microstructure, optical properties, residual stress and laser induced damage threshold of amorphous HfO2 thin filmsArticle