RahulArora, S. K.Jha, S. N.Yogesh Kumar2022-12-092022-12-092022Materials Letters, 2022. Vol. 311: pp. 1-4: Article no. 131600http://hdl.handle.net/123456789/253704141 bytestext/htmlenSemiconductorsInterfacesXPSDetermination of band alignment in liquid exfoliated few-layer WSe2/SiO2 interfaceArticle