Banu, N.Singh, S.Basu, Saibal2019-09-042019-09-042018Nanotechnology, 2018. Vol. 29: Article no. 195703http://hdl.handle.net/123456789/192504248 bytestext/htmlenpolarized neutron reflectometry (PNR)x-ray reflectivity (XRR)thin filmthin film magnetismHigh density nonmagnetic cobalt in thin filmsArticle