Singh, D. K.Dikshit, B.Vijayan, R.Mukherjee, J.Rawat, V. S.2023-12-012023-12-012023IEEE Transactions on Electromagnetic Compatibility, 2023. Vol. 65: pp. 58-68http://hdl.handle.net/123456789/261704462 bytestext/htmlenConducted noisecopper vapor laser (CVL)electrical gas dischargeelectrode geometryelectromagnetic interference (EMI)Evaluation of Conducted Electromagnetic Interference Behavior of Copper Vapor LaserArticle