Annealing induced structural changes in sputtered AglnSbTe thin films and its implication on electrical properties

Singh, J.Aswal, D. K.Gupta, S. K.2016-05-052016-05-052015Materials Research Express, 2015. Vol. 2 (6): pp. 1-8: Article no. 066403http://hdl.handle.net/123456789/129834359 bytestext/htmlenAgInSbTethin filmsRoom temperature crystalline resistivity 300KAnnealing induced structural changes in sputtered AglnSbTe thin films and its implication on electrical propertiesArticle