Murugesan, M.Paulraj, R.Tyagi, M.2022-04-262022-04-262021Journal of Materials Science-Materials in Elecronics, 2021. Vol. 32 (11): pp. 15200-15210http://hdl.handle.net/123456789/244224945 bytestext/htmlen<100> directed growthHirshfeld surface analysisscintillation propertytrans-Stilbene (TSB) single crystal growthmodified low-temperature vertical Bridgman method<100> directed growth, Hirshfeld surface analysis, and scintillation properties of trans-Stilbene (TSB) single crystal grown by modified low-temperature vertical Bridgman methodArticle