Sawant, P.Varma, S.Gonal, M. R.Wani, B. N.Prakash, D.Bharadwaj, S. R.2014-07-092014-07-092014Electrochimica Acta, 2014. Vol. 120: pp. 80-85http://hdl.handle.net/123456789/96304490 bytestext/htmlenCermetX-ray diffractionElectrical conductivityFour probeSingle CellEffect of Ni Concentration on Phase Stability, Microstructure and Electrical Properties of BaCe0.8Y0.2O3-δ - Ni Cermet SOFC Anode and its application in proton conducting ITSOFCArticle