Sunil KumarShankar, A.Kishore, N.Mukherjee, C.Kamparath, R.Thakur, S.2019-05-232019-05-232019Optik, 2019. Vol. 176: pp. 438-447http://hdl.handle.net/123456789/185074285 bytestext/htmlenQuarter wave thicknessReflectivityMultilayersDamage thresholdLaser Induced Damage Threshold of Ta2O5 and Ta2O5/SiO2 Films at 532 and 1064 nmArticle