De, R.Haque, S. M.Tripathi, S.Prathap, C.Rao, K. D.Sahoo, N. K.2017-02-132017-02-132016AIP Conference Proceedings, 2016. Vol. 1731: pp. 080078.1-080078.3http://hdl.handle.net/123456789/140714080 bytestext/htmlenSputteringX-ray diffractionRefractive indexEffect of sputtering power on MgF2 thin films deposited by sputtering technique under fluorine trappingArticle