Kewlani, H. M.Gharat, S. H.Roychowdhury, P.Dikshit, B.2024-07-192024-07-192022Journal of Instrumentation (JINST), 2022. Vol. 17: Article no. P09016http://hdl.handle.net/123456789/269894260 bytestext/htmlenData acquisition conceptsIon sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))Plasma diagnostics - probesPlasma generation (laserproduced, RF, x ray-produced)Plasma characterization in CW and pulsed mode and its effect on beam current in 2.45 GHz ECR Ion sourceArticle