Correlation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopy

Sahoo, N. K.Senthilkumar, M.Thakur, S.Bhattacharyya, D.2019-07-082019-07-082002Applied Surface Science, 2002. Vol. 200: pp. 219-230http://hdl.handle.net/123456789/188084151 bytestext/htmlenGadolinium oxideMicrostructural propertiesoptical propertiesellipsometrysurface topographyE-beam evaporationCorrelation of optical and microstructural properties of Gd2O3 thin films through phase-modulated ellipsometry and multi-mode atomic force microscopyArticle