Garg, A. B.Thangadurai, P.Meenakshi, S.Ramasamy, S.2013-04-032013-04-032012Journal of Physics-Conference Series, 2012. Vol. 377 (1): pp. 012022http://hdl.handle.net/123456789/71543765 bytestext/htmlenSynchrotron based XRD studynano crystalline SnO2 under pressurehigh pressure x ray diffraction measurementsstructural phase transitionSynchrotron based XRD study on nano crystalline SnO2 under pressureArticle