Quantification of 1.75 MeV Xe5+ induced defects in zirconia doped ceria (Ce0.8Zr0.2O2)

Vivek KumarSharma, S. K.Singh, Y.Grover, V.2024-02-282024-02-282023Journal of Applied Physics, 2023. Vol. 134: Article no. 65902http://hdl.handle.net/123456789/265234999 bytestext/htmlenQuantification of 1.75 MeV Xe5+ induced defectszirconia doped ceria (Ce0.8Zr0.2O2)structural stabilityamorphization and grain fragmentatioQuantification of 1.75 MeV Xe5+ induced defects in zirconia doped ceria (Ce0.8Zr0.2O2)Article