Ray, A.Choudhury, S.Singh, V.Betty, C. A.Rao, T. V. C.2020-03-162020-03-162019British Journal of Radiology, 2019. Vol. 42: Article no. 277http://hdl.handle.net/123456789/204564032 bytestext/htmlenTin oxidenanoparticlespassivationsurface-barrierdetectorJunction edge passivation study of silicon surface barrier detectors using organic films deposited by L–B techniqueArticle