Jose, F.Ramaseshan, R.Tripura, S. S.Jain, D.Ganesan, V.Chandramohan, P.Srinivasan, M. P.Tyagi, A. K.Raj, B.2012-04-122012-04-122011Materials Chemistry and Physics, 2011. Vol. 130 (3): pp. 1033-1037http://hdl.handle.net/123456789/61304486 bytestext/htmlenSputteringThin filmsGrazing Incidence X-ray DiffractionAtomic Force MicroscopyRaman Spectroscopy and scatteringEllipsometerSignificance of Al on the morphological and optical properties of Ti1-xAlxN thin filmsArticle