High-resolution study of x-rays emitted from highly charged S ions using a bent-crystal spectrometer

Kasthurirangan, S.Banerjee, A.A. KumarAgnihotri, A. N.Misra, D.Tribedi, L. C.2014-05-262014-05-262013Physica Scripta, 2013. Vol. T156: Article no. 014009http://hdl.handle.net/123456789/93883773 bytestext/htmlenHigh-resolution studyX-ray spectroscopyS ionsbent-crystal spectrometerHigh-resolution study of x-rays emitted from highly charged S ions using a bent-crystal spectrometerArticle