Swain, M.Bhattacharya, D.Basu, Saibal2015-05-152015-05-152014AIP Conference Proceedings, 2014. Vol. 1591: pp. 946-947http://hdl.handle.net/123456789/110273823 bytestext/htmlenMultilayerX-Ray ReflectometryInterface structure and roughnessDeposition of Optical Quality Cu/Ti FilmsArticle