Singh, S. D.Nand, M.Ajimsha, R. S.Upadhyay, A.Kamparath, R.Mukherjee, C.Misra, P.Sinha, A. K.Jha, S. N.Ganguli, T.2016-12-222016-12-222016Applied Surface Science, 2016. Vol. 389: pp. 835-839http://hdl.handle.net/123456789/138663963 bytestext/htmlenBand offsetPhotoelectron spectroscopyXRDWide band gap semiconductorsDetermination of band offsets at strained NiO and MgO heterojunction for MgO as an interlayer in heterojunction light emitting diode applicationsArticle