Srinivasan, N.Kain, V.Samajdar, I.Mani Krishna, K. V.Sivaprasad, P. V.2018-05-182018-05-182017Materials Today-Proceedings, 2017. Vol. 4 (9): pp. 09888-09892http://hdl.handle.net/123456789/162054180 bytestext/htmlenPlastic deformationSanicro 28Electron Backscattered DiffractionMisorientationPlane strain compression testing of Sanicro 28 by channel-die compression test: A direct microstructural observationArticle