X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy

Kapoor, K.Lahiri, D.Batra, I. S.2018-12-312018-12-312005Materials Characterization, 2005. Vol. 54: pp. 131-140http://hdl.handle.net/123456789/175254044 bytestext/htmlenStacking fault probabilityStacking fault energyX-ray line profile analysisCu-Cr-Zr alloyX-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloyArticle