Sahoo, Naba K.Thakur, SudhakarTokas, Raj B.SenthilKumar, M.2007-09-182007-09-182006http://hdl.handle.net/123456789/6074713 bytestext/htmlenForce– distance microscopyOptical multilayerPost-growth aging processOptical coatingMultilayer morphologyScanning probe microscopyCorrelation of atomic force–distance microscopy and spectrosphotometric techniques in the analysis of optical multilayer spectral aging processArticle