Singh, S. D.Poswal, A. K.Kamal, C.Rajput, P.Chakrabarti, A.Jha, S. N.Ganguli, T.2017-11-062017-11-062017Solid State Communications, 2017. Vol. 259: pp. 40-44http://hdl.handle.net/123456789/152304648 bytestext/htmlenOxide semiconductorsLocal structureEXAFSBond length variation in Zn substituted NiO studied from extended X-ray absorption fine structureArticle