Thangavel, S.Dash, K.Dhavile, S. M.Sahayam, A. C.2014-04-102014-04-102013Analytical Methods, 2013. Vol. 5 (20): pp. 5799-5803http://hdl.handle.net/123456789/90854148 bytestext/htmlentrace levels determinationborongraphite powderinductively coupled plasma-optical emission spectrometryICP-OESDetermination of trace levels of boron in graphite powder by inductively coupled plasma-optical emission spectrometry (ICP-OES)Article