Bera, G.Surampalli, A.Mal, P.Rajput, P.2022-05-262022-05-262021Journal of Materials Science-Materials in Electronics, 2021. Vol. 32: pp. 7399- 7409http://hdl.handle.net/123456789/245794623 bytestext/htmlenStructural, magnetic, dielectricMossbauer spectroscopic studtype-II multiferroic materialX-ray diffraction (XRD)Raman spectroscopic measurementsStructural, magnetic, dielectric and 57Fe Mossbauer spectroscopic studies on Fe1-xCexVO4: a type-II multiferroic materialArticle