Rao, K. S.Salunke, H. G.Muthe, K. P.Kulkarni, M. S.2020-03-062020-03-062019AIP Conference Proceedings, 2019. Vol. 2115: Article no. 030356http://hdl.handle.net/123456789/203863846 bytestext/htmlenMultiple Intrinsic DefectsCarbon doped aluminahighly sensitive Optically Stimulated Dosimeter(OSL) phosphorC atomsDistribution of multiple intrinsic defects in C doped α-Al2O3Article