Total reflection X-ray fluorescence analysis of high purity quartz: A bottom-up approach of uncertainty evaluation

Remya Devi, P. S.Chavan, T. A.Ghosh, M.Swain, K. K.2022-01-272022-01-272021Spectrochimica Acta-B, 2021. Vol. 178: Article no. 106127http://hdl.handle.net/123456789/239144558 bytestext/htmlenTotal reflection X-ray fluorescenceQuartzUncertaintyAccuracyDetection limitTotal reflection X-ray fluorescence analysis of high purity quartz: A bottom-up approach of uncertainty evaluationArticle