Sharma, R. K.Sinha, A. K.Gupta, N.Nuwad, J.JagannathGadkari, S. C.Singh, M. R.Gupta, S. K.2015-05-132015-05-132014AIP Conference Proceedings, 2014. Vol. 1591: pp. 916-918http://hdl.handle.net/123456789/110244180 bytestext/htmlenNEGActivation TemperatureSEYSecondary electron measurement and XPS characterization of NEG coatingsArticle