Shailendra KumarJha, S. N.JagannathGanguli, T.Bhaskara Rao, S. V. N.Das, N. C.2021-03-172021-03-172004Applied Surface Science, 2004. Vol. 229 (42826): pp. 324-332http://hdl.handle.net/123456789/225504333 bytestext/htmlenPhotoemission spectroscopyDepleted semiconductor filmsValence bands offset between depleted semiconductors measured by photoelectron spectroscopyArticle