Sasikala, R.Sudarsan, V.Kulshreshtha, S. K.2019-10-042019-10-042002Journal of Solid State Chemistry, 2002. Vol. 169: pp. 113-117http://hdl.handle.net/123456789/196364298 bytestext/htmlenCeO2Al2O327Al NMR40ppm peakX-ray diffractionTPR27Al NMRstudies of Ce-Al mixed oxides: origin of 40 ppm peakArticle