Chang, M. H.Das, D.Varde, P. V.Pecht, M.2012-12-132012-12-132012Microelectronics Reliability, 2012. Vol. 52 (5): pp. 762-782http://hdl.handle.net/123456789/68884719 bytestext/htmlenLight emitting diodes reliability reviewmicroelectronicsLED developersend-product manufacturers focus resourcesArticle