Jagadale, T. C.Prasad, V.Ramgir, N. S.Prajapat, C.Patil, U. V.Debnath, A.Aswal, D. K.Gupta, S. K.2016-05-042016-05-042015RSC Advances, 2015. Vol. 5 (113): pp. 93081-93088http://hdl.handle.net/123456789/129614259 bytestext/htmlenenhanced H2S sensitivitydefect-rich titanium oxide filmsX-ray absorption spectroscopy measurementslaser energyGreatly enhanced H2S sensitivity using defect-rich titanium oxide filmsArticle