Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique

Nanekar, P.Jothilakshmi, N.Anish Kumar2020-11-172020-11-172019Measurement Science & Technology, 2019. Vol. 147: Article no. 106845http://hdl.handle.net/123456789/213794274 bytestext/htmlenPhased arraySAFTFull matrix captureFlaw characterizationWeld defectsCharacterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing techniqueArticle