Raut, B. T.Pawar, S. G.Chougule, M. A.Sen, S.Patil, V. B.2012-01-062012-01-062011Journal of Alloys and Compounds, 2011. Vol. 509 (37): pp. 9065-9070http://hdl.handle.net/123456789/55814312 bytestext/htmlenNickel oxideSol–gel methodStructural propertiesOptoelectronic propertiesNew process for synthesis of nickel oxide thin films and their characterizationArticle