Sahoo, N. K.Tokas, Raj B.Thakur, SudhakarKamble, N. M.2007-09-172007-09-172006http://hdl.handle.net/123456789/5624248 bytestext/htmlenComposite optical thin-filmzirconia-silica compositemicroscopymorphological propertiesforce-distance microscopyco-deposition processForce–Distance Spectroscopy Morphology Statistics Studies of Composite Zirconia-Silica Thin FilmsArticle