Yadav, A. K.Haque, S. M.Shukla, D.Choudhary, R. J.Jha, S. N.Bhattacharyya, D.2016-04-062016-04-062015AIP Advances, 2015. Vol. 5 (11): pp. 117138.1-117138.17http://hdl.handle.net/123456789/127643977 bytestext/htmlenX-ray absorption spectroscopyMn doped ZnO thin filmsrf sputtering techniqueEXAFS and XANES measurementsX-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering techniqueArticle