Basak, A.Bhatia, R. K.Yadav, V. K.Ravisankar, E.Saha, T. K.Nataraju, V.Gadkari, S. C.2018-06-112018-06-112017International Journal of Mass Spectrometry, 2017. Vol. 423: pp. 33-38http://hdl.handle.net/123456789/163613878 bytestext/htmlenSensitivityIon sourceIon opticsTIMSMagnetic sector analyzerIsotope ratioAn improved ion source for thermal ionization mass spectrometerArticle