Sahoo, Naba K.Tokas, Raj B.Thakur, Sudhakar2007-09-172007-09-172006http://hdl.handle.net/123456789/5544147 bytestext/htmlenOptical coatingsCodepositionElectron beam evaporationThin film multilayersEllipsometrySpectrophotometryAtomic force microscopyGd2O3 compositeSiO2 compositeTauc–Lorentz formulationsAnalysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric techniqueArticle