Bhattacharyya, D.Poswal, A. K.Dey, G. K.Das, N. C.2019-09-242019-09-242004Vacuum, 2004. Vol. 76: pp. 31-36http://hdl.handle.net/123456789/195094053 bytestext/htmlenSurface roughnessInterface diffusionSpectroscopic EllipsometryXTEMInvestigation of Mo/Si and W/Si Interfaces by Phase Modulated Spectroscopic Ellipsometry and Cross-Sectional Transmission Electron MicroscopyArticle