Karri, M.Singh, J. B.Mani Krishna, K. V.Kumawat, B. K.Naveen KumarSrivastava, D.2018-01-122018-01-122017Materials Science and Engineering-A, 2017. Vol. 700: pp. 75-81http://hdl.handle.net/123456789/154675020 bytestext/htmlenX-ray diffractionTransmission electron microscopyDislocation densityPeak profile analysisVariance methodsOn the suitability of peak profile analysis models for estimating dislocation densityArticle